Dr Manijeh Reyhani hosted teachers at the Scanning Probe Microscopy Facility, a part of the Nanochemistry Research Institute at Curtin University of Technology. The Scanning Probe Microscopy Facility consists of instruments that provide very high resolution, three-dimensional surface topography on an increasing variety of samples and are powerful tools for surface examination.
 |
 |
 |
The Atomic Force Microscope (AFM) uses the sense of touch and measures the topography by mechanically moving a sharp probe across the sample to "feel" the contours of the surface in a manner similar to a phonograph stylus tracing the grooves of a record. Moreover, it can operate under liquids, including the corrosive solutions frequently encountered in industry. Teachers were introduced to the physics behind this instrument and shown techniques used to visualise crystal structure down to the unit cell level.
 |
 |
 |